Title :
Polarization Measurement Using Two-Photon Absorption of a Si Avalanche Photodiode
Author :
Kagawa, Toshiaki
Author_Institution :
Shonan Inst. of Technol., Fujisawa
Abstract :
Polarization of 1.55-mum-wavelength light was measured by using two-photon absorption (TPA) of a Si avalanche photodiode (APD). The APD was illuminated with the light under test and with linearly polarized light. The photocurrent produced by the cross-TPA was used to determine the polarization of the light under test.
Keywords :
avalanche photodiodes; light polarisation; photoconductivity; polarimetry; two-photon spectra; Si; Si avalanche photodiode; light polarization; photocurrent; polarization measurement; two-photon absorption; wavelength 1.55 mum; Absorption; Avalanche photodiodes; Frequency; Optical fiber polarization; Optical polarization; Optical pulse generation; Optical retarders; Photoconductivity; Pulse amplifiers; Testing;
Conference_Titel :
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1173-3
Electronic_ISBN :
978-1-4244-1174-0
DOI :
10.1109/CLEOPR.2007.4391640
