DocumentCode :
2250128
Title :
Spin-polarized scanning tunneling microscopy using optically pumped GaAs tips
Author :
Miura, T. ; Yamaguchi, K.
Author_Institution :
Dept. of Electron. Eng., Univ. of Electro-Communications, Tokyo, Japan
fYear :
2001
fDate :
Oct. 31 2001-Nov. 2 2001
Firstpage :
160
Lastpage :
161
Abstract :
We have developed micro-fabricated GaAs tips for application to spin-polarized scanning tunneling microscopy (SP-STM). In the case of SP-STM measurements using the GaAs tip and a magnetic sample, the tunneling current slightly changes by switching between right and left circularly polarized light pumping, i.e. the different current component includes a spin-dependent signal of the sample surface. However, this difference of the tunneling current is easy to fluctuate and frequently depends on a topographic component. In this study, the polarized light modulation method and the tunneling current detection method are improved. As a result, the spin-dependent tunneling spectra can be detected reproducibly, and the topography-dependent signal is also suppressed successfully in the SP-STM imaging.
Keywords :
III-V semiconductors; electron spin polarisation; gallium arsenide; light polarisation; optical pumping; scanning tunnelling microscopy; surface magnetism; surface topography; GaAs:Zn; SP-STM system; Zn-doped GaAs[100] substrate; circularly-polarized-light-pumped semiconductor; magnetic sample; micro-fabricated GaAs tips; optically pumped GaAs tips; polarized light modulation method; spin-dependent tunneling spectra; spin-polarized electrons; spin-polarized scanning tunneling microscopy; surface spin structure; topographic component; topography-dependent signal suppression; tunneling current; tunneling current detection method; Current measurement; Gallium arsenide; Magnetic switching; Magnetic tunneling; Optical imaging; Optical microscopy; Optical modulation; Optical polarization; Optical pumping; Surface topography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2001 International
Conference_Location :
Shimane, Japan
Print_ISBN :
4-89114-017-8
Type :
conf
DOI :
10.1109/IMNC.2001.984139
Filename :
984139
Link To Document :
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