• DocumentCode
    2250143
  • Title

    Waferless pattern recognition recipe creation using StatTrax

  • Author

    Ridens, Martin G. ; Wilson, Eric R. ; Harris, Thomas A.

  • Author_Institution
    Motorola Inc., Chandler, AZ, USA
  • fYear
    1996
  • fDate
    12-14 Nov 1996
  • Firstpage
    353
  • Lastpage
    358
  • Abstract
    Motorola MOS-12 uses Tencor UV-1050 and FT-750 Film Thickness probes for on product measurements at many steps in the fabrication process. Master recipes are manually created for the first mask set of any new process flow. By utilizing a standard scribe grid structure, recipes for subsequent mask sets are created by copying the master recipes then making changes to the coordinates in the die map and pattern recognition sections of each recipe. The ability to create recipes this way reduces engineering time required for new product introduction and significantly reduces cycle time for lead lots. The method provides the best recipe integrity possible and allows the elimination of costly test wafers
  • Keywords
    MOS integrated circuits; integrated circuit measurement; integrated circuit testing; masks; pattern recognition; probes; production testing; StatTrax; Tencor FT-750; Tencor UV-1050; cycle time; die map; engineering time; fabrication process; film thickness probes; lead lots; mask; new product introduction; on product measurements; pattern recognition sections; recipe creation; standard scribe grid structure; waferless pattern recognition; Area measurement; Etching; Metrology; Monitoring; Pattern recognition; Probes; Process control; Software measurement; Testing; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1996. ASMC 96 Proceedings. IEEE/SEMI 1996
  • Conference_Location
    Cambridge, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-3371-3
  • Type

    conf

  • DOI
    10.1109/ASMC.1996.558077
  • Filename
    558077