DocumentCode
2250143
Title
Waferless pattern recognition recipe creation using StatTrax
Author
Ridens, Martin G. ; Wilson, Eric R. ; Harris, Thomas A.
Author_Institution
Motorola Inc., Chandler, AZ, USA
fYear
1996
fDate
12-14 Nov 1996
Firstpage
353
Lastpage
358
Abstract
Motorola MOS-12 uses Tencor UV-1050 and FT-750 Film Thickness probes for on product measurements at many steps in the fabrication process. Master recipes are manually created for the first mask set of any new process flow. By utilizing a standard scribe grid structure, recipes for subsequent mask sets are created by copying the master recipes then making changes to the coordinates in the die map and pattern recognition sections of each recipe. The ability to create recipes this way reduces engineering time required for new product introduction and significantly reduces cycle time for lead lots. The method provides the best recipe integrity possible and allows the elimination of costly test wafers
Keywords
MOS integrated circuits; integrated circuit measurement; integrated circuit testing; masks; pattern recognition; probes; production testing; StatTrax; Tencor FT-750; Tencor UV-1050; cycle time; die map; engineering time; fabrication process; film thickness probes; lead lots; mask; new product introduction; on product measurements; pattern recognition sections; recipe creation; standard scribe grid structure; waferless pattern recognition; Area measurement; Etching; Metrology; Monitoring; Pattern recognition; Probes; Process control; Software measurement; Testing; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1996. ASMC 96 Proceedings. IEEE/SEMI 1996
Conference_Location
Cambridge, MA
ISSN
1078-8743
Print_ISBN
0-7803-3371-3
Type
conf
DOI
10.1109/ASMC.1996.558077
Filename
558077
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