DocumentCode :
2250151
Title :
Crosstalk avoidance and error-correction coding for coupled RLC interconnects
Author :
Rahaman, Md Sajjad ; Chowdhury, Masud H.
Author_Institution :
Dept. of ECE, Univ. of Illinois at Chicago, Chicago, IL, USA
fYear :
2009
fDate :
24-27 May 2009
Firstpage :
141
Lastpage :
144
Abstract :
On-chip interconnect delay and crosstalk noise have become an important factor for performance and signal integrity as a result of increase in device densities and operating clock frequency in deep sub-micrometer (DSM) VLSI circuits. With faster rise times and lower resistance, interconnects exhibit significant inductive effect compared to capacitive effect. Therefore, various existing coding techniques for capacitive crosstalk reduction in resistive-capacitance (RC) interconnects are not suitable for resistive-inductance-capacitance (RLC) interconnects in high-speed circuits. At the same time, on-chip interconnects are susceptible to various DSM noise sources. Error-correction coding (ECC) improves interconnect-reliability against DSM noise. This paper proposes a modified boundary shift coding technique that simultaneously addresses inductance-dominant cross-talk noise reduction and error-correction for coupled RLC interconnects. Results show that proposed coding achieves up to 50% reduction in additional wiring requirement.
Keywords :
RLC circuits; VLSI; coupled circuits; crosstalk; error correction codes; integrated circuit interconnections; integrated circuit noise; VLSI circuits; coupled RLC interconnects; crosstalk avoidance; crosstalk noise; deep submicrometer; error-correction coding; onchip interconnect delay; resistive-capacitance interconnects; resistive-inductance-capacitance interconnects; signal integrity; Circuit noise; Clocks; Coupling circuits; Crosstalk; Delay; Error correction codes; Frequency; Integrated circuit interconnections; RLC circuits; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3827-3
Electronic_ISBN :
978-1-4244-3828-0
Type :
conf
DOI :
10.1109/ISCAS.2009.5117705
Filename :
5117705
Link To Document :
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