• DocumentCode
    2250151
  • Title

    Crosstalk avoidance and error-correction coding for coupled RLC interconnects

  • Author

    Rahaman, Md Sajjad ; Chowdhury, Masud H.

  • Author_Institution
    Dept. of ECE, Univ. of Illinois at Chicago, Chicago, IL, USA
  • fYear
    2009
  • fDate
    24-27 May 2009
  • Firstpage
    141
  • Lastpage
    144
  • Abstract
    On-chip interconnect delay and crosstalk noise have become an important factor for performance and signal integrity as a result of increase in device densities and operating clock frequency in deep sub-micrometer (DSM) VLSI circuits. With faster rise times and lower resistance, interconnects exhibit significant inductive effect compared to capacitive effect. Therefore, various existing coding techniques for capacitive crosstalk reduction in resistive-capacitance (RC) interconnects are not suitable for resistive-inductance-capacitance (RLC) interconnects in high-speed circuits. At the same time, on-chip interconnects are susceptible to various DSM noise sources. Error-correction coding (ECC) improves interconnect-reliability against DSM noise. This paper proposes a modified boundary shift coding technique that simultaneously addresses inductance-dominant cross-talk noise reduction and error-correction for coupled RLC interconnects. Results show that proposed coding achieves up to 50% reduction in additional wiring requirement.
  • Keywords
    RLC circuits; VLSI; coupled circuits; crosstalk; error correction codes; integrated circuit interconnections; integrated circuit noise; VLSI circuits; coupled RLC interconnects; crosstalk avoidance; crosstalk noise; deep submicrometer; error-correction coding; onchip interconnect delay; resistive-capacitance interconnects; resistive-inductance-capacitance interconnects; signal integrity; Circuit noise; Clocks; Coupling circuits; Crosstalk; Delay; Error correction codes; Frequency; Integrated circuit interconnections; RLC circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3827-3
  • Electronic_ISBN
    978-1-4244-3828-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.2009.5117705
  • Filename
    5117705