DocumentCode
2250151
Title
Crosstalk avoidance and error-correction coding for coupled RLC interconnects
Author
Rahaman, Md Sajjad ; Chowdhury, Masud H.
Author_Institution
Dept. of ECE, Univ. of Illinois at Chicago, Chicago, IL, USA
fYear
2009
fDate
24-27 May 2009
Firstpage
141
Lastpage
144
Abstract
On-chip interconnect delay and crosstalk noise have become an important factor for performance and signal integrity as a result of increase in device densities and operating clock frequency in deep sub-micrometer (DSM) VLSI circuits. With faster rise times and lower resistance, interconnects exhibit significant inductive effect compared to capacitive effect. Therefore, various existing coding techniques for capacitive crosstalk reduction in resistive-capacitance (RC) interconnects are not suitable for resistive-inductance-capacitance (RLC) interconnects in high-speed circuits. At the same time, on-chip interconnects are susceptible to various DSM noise sources. Error-correction coding (ECC) improves interconnect-reliability against DSM noise. This paper proposes a modified boundary shift coding technique that simultaneously addresses inductance-dominant cross-talk noise reduction and error-correction for coupled RLC interconnects. Results show that proposed coding achieves up to 50% reduction in additional wiring requirement.
Keywords
RLC circuits; VLSI; coupled circuits; crosstalk; error correction codes; integrated circuit interconnections; integrated circuit noise; VLSI circuits; coupled RLC interconnects; crosstalk avoidance; crosstalk noise; deep submicrometer; error-correction coding; onchip interconnect delay; resistive-capacitance interconnects; resistive-inductance-capacitance interconnects; signal integrity; Circuit noise; Clocks; Coupling circuits; Crosstalk; Delay; Error correction codes; Frequency; Integrated circuit interconnections; RLC circuits; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
Conference_Location
Taipei
Print_ISBN
978-1-4244-3827-3
Electronic_ISBN
978-1-4244-3828-0
Type
conf
DOI
10.1109/ISCAS.2009.5117705
Filename
5117705
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