Title :
Formation of aluminum nano-dot array by the use of nano-indentation and anodic oxidation
Author :
Murakami, Y. ; Shingubara, S. ; Sakaue, H. ; Takahagi, T.
Author_Institution :
Graduate Sch. of ADSM, Hiroshima Univ., Higashi-Hiroshima, Japan
fDate :
Oct. 31 2001-Nov. 2 2001
Abstract :
Nanohole tetragonal and trigonal arrays as well as Al dot tetragonal and hexagonal arrays were successfully formed on Si substrates by the use of AFM nano-indentation and anodic oxidation. The ordered array of nanoholes could be obtained only at an indenting interval that depended on the anodic voltage. An Al dot hexagonal array with the nearest neighbor distance of 34 nm was formed. For further shrinkage of the Al dots, reduction of the indenting interval at an adequate anodic voltage would be necessary.
Keywords :
aluminium; anodisation; arrays; atomic force microscopy; etching; indentation; nanotechnology; quantum dots; 34 nm; AFM; Al; Al dot hexagonal array; Al nano-dot array; Si; Si substrates; anodic oxidation; anodic voltage; indenting interval; nano-indentation; nanohole tetragonal arrays; nanohole trigonal arrays; nearest neighbor distance; ordered nanohole array; wet chemical selective etching; Aluminum; Nearest neighbor searches; Oxidation; Rough surfaces; Semiconductor films; Size control; Substrates; Surface roughness; Voltage; Wet etching;
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2001 International
Conference_Location :
Shimane, Japan
Print_ISBN :
4-89114-017-8
DOI :
10.1109/IMNC.2001.984142