Title :
Statistical properties of scattering loss and mode splitting in microdisk resonators
Author :
Li, Qing ; Eftekhar, Ali A. ; Adibi, Ali
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
We report an experimental observation that in high-Q silicon microdisk resonators, the intrinsic Q and mode splitting can vary significantly over the azimuthal orders. A theoretical roughness model qualitatively explains the observed results.
Keywords :
integrated optics; micromechanical resonators; optical resonators; high-Q silicon microdisk resonators; mode splitting; scattering loss; statistical properties; Curve fitting; Finite element methods; Optical losses; Optical resonators; Scattering; Silicon; Solids;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
