DocumentCode :
2250480
Title :
Design and analysis of the on-chip ESD protection circuit with a constant input capacitance for high-precision analog applications
Author :
Ker, Ming-Dou ; Chen, Tung-Yang ; Wu, Chung-Yu ; Chang, Hun-Hsien
Author_Institution :
Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume :
5
fYear :
2000
fDate :
2000
Firstpage :
61
Abstract :
An on-chip ESD protection design is proposed to solve the ESD protection challenge to the analog pins for high-precision applications. A design model to find the optimized device dimensions and layout spacings on the input ESD clamp devices has been developed to keep the total input capacitance almost constant (within 1% variation), even if the analog signal has an input dynamic range of 1 V. The device dimension (W/L) of the ESD clamp device connected to the I/O pad in the analog ESD protection circuit can be reduced to only 50/0.5 (μm/μm) in a 0.35 μm silicided CMOS process, but it can sustain the HBM (MM) ESD level of up to 6 kV (400 V). With such a smaller device dimension, the input capacitance of this analog ESD protection circuit can be significantly reduced to only ~1.0 pF (including the bond pad capacitance) for high-frequency applications
Keywords :
CMOS analogue integrated circuits; capacitance; electrostatic discharge; integrated circuit design; 0.35 micron; 1 pF; 400 V; constant input capacitance; design model; high-frequency applications; high-precision analog applications; input ESD clamp devices; onchip ESD protection circuit; optimized device dimensions; optimized layout spacings; silicided CMOS process; Capacitance; Circuits; Clamps; Design optimization; Dynamic range; Electrostatic discharge; Pins; Protection; Signal design; Signal processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location :
Geneva
Print_ISBN :
0-7803-5482-6
Type :
conf
DOI :
10.1109/ISCAS.2000.857363
Filename :
857363
Link To Document :
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