Title :
Comparison and analysis of phase noise in ring oscillators
Author :
Dai, Liang ; Harjani, Ramesh
Author_Institution :
Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
Abstract :
Voltage-controlled oscillators are widely used circuit blocks, particularly in phase-locked loops. As CMOS is the technology of choice for many applications, CMOS oscillators with low phase noise and timing jitter are highly desired. CMOS ring oscillators with five different delay cell topologies have been designed, fabricated and evaluated for phase noise performance. Our results show that ring oscillators with linear loads provide much better phase noise performance than oscillators with nonlinear loads. We also observe that well designed single-ended oscillators have phase noise that is on par or better than oscillators with fully differential delay stages. Both our analysis and measurement results suggest that large signal voltage swing and improved linearity of the delay cells help reduce oscillator phase noise
Keywords :
CMOS digital integrated circuits; delay circuits; integrated circuit noise; network analysis; phase locked loops; phase noise; voltage-controlled oscillators; CMOS PLL application; CMOS VCO; CMOS oscillators; delay cell linearity; delay cell topologies; fully differential delay stages; large signal voltage swing; linear loads; nonlinear loads; oscillator phase noise reduction; phase noise performance; ring oscillators; single-ended oscillators; voltage-controlled oscillators; CMOS technology; Circuit topology; Delay; Noise measurement; Phase locked loops; Phase noise; Ring oscillators; Signal analysis; Timing jitter; Voltage-controlled oscillators;
Conference_Titel :
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location :
Geneva
Print_ISBN :
0-7803-5482-6
DOI :
10.1109/ISCAS.2000.857367