DocumentCode :
2250582
Title :
Influence of stiffness change due to mass loading on resonant microcantilever mass sensor´s performance
Author :
Zihajehzadeh, Sh ; Maroufi, M. ; Shamshirsaz, M. ; Rezaie, A.H.
Author_Institution :
New Technol. Res. Center, Amirkabir Univ. of Technol. (Tehran Polytech.), Tehran, Iran
fYear :
2010
fDate :
6-9 July 2010
Firstpage :
1008
Lastpage :
1012
Abstract :
Capability of piezoelectric microcantilever mass sensors to detect very small amount of mass, such as detection of a single virus has attracted many researchers´ interests. In many cases, detection of mass is performed by adsorbing of materials in porous matrixes on the sensor surface, in which the adsorbed material does not form a solid layer on the cantilever surface. On the other hand, there are materials such as gold and mercury that constitute a solid layer on cantilever surface. The thickness and the young modulus of this layer, increase the cantilever´s stiffness. Consequently, both the mass and the stiffness changes, alter the cantilever´s natural frequency, which should be considered in modeling. Two lumped parameter modeling approach for resonant microcantilevers mass sensors has been investigated. Model I neglects the stiffness change of the cantilever sensor after mass loading. In model II the added mass constitutes a solid layer on the cantilever bottom surface. This additional solid layer affects the mass and also the stiffness of microcantilever. The results shown that model II represents a better modeling comparing to model I with respect to experimental data. For cantilevers of the same thickness in this study, the stiffness variation percentage due to added mass layer remains constant. Furthermore, the deviation between model I and model II is the same regardless the cantilevers dimensions.
Keywords :
cantilevers; microsensors; piezoelectric devices; piezoelectric materials; adsorbed material; lumped parameter modeling; mass loading; piezoelectric microcantilever mass sensors; resonant microcantilever mass sensor; stiffness change; Data models; Load modeling; Loading; Sensitivity; Sensors; Solids;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Intelligent Mechatronics (AIM), 2010 IEEE/ASME International Conference on
Conference_Location :
Montreal, ON
Print_ISBN :
978-1-4244-8031-9
Type :
conf
DOI :
10.1109/AIM.2010.5695900
Filename :
5695900
Link To Document :
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