Robust Statistical Multi-line TRL Calibration Approach for Microwave Device Characterization

Author

López-González, F.J. ; Márquez-Segura, E. ; Otero, P. ; Camacho-Penalosa, C.

Author_Institution

Departamento de Ingenieria de Comunicaciones, Universidad de Malaga

fYear

2006

fDate

16-19 May 2006

Firstpage

187

Lastpage

190

Abstract

This communication shows the features and comparisons of several robust statistical techniques applied to enhance the TRL calibration algorithm for S-parameters measurements using vector network analyzers. The use of several lines allows the reduction of the noise in the measurements and an appreciable increase in the frequency bandwidth of the TRL application. The Huber estimator is proposed to enhance the reduction of the random errors effects in the calibration process. Simulation and experimental measurements has been carried out to assess the validity of the proposed methodology

Keywords

calibration; microwave devices; network analysers; statistical analysis; Huber estimator; S-parameters measurements; frequency bandwidth; microwave device characterization; noise reduction; random error effects; robust statistical multi-line TRL calibration approach; vector network analyzers; Algorithm design and analysis; Bandwidth; Calibration; Frequency measurement; Microwave communication; Microwave devices; Noise measurement; Noise reduction; Noise robustness; Scattering parameters;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrotechnical Conference, 2006. MELECON 2006. IEEE Mediterranean

Conference_Location

Malaga

Print_ISBN

1-4244-0087-2

Type

conf

DOI

10.1109/MELCON.2006.1653068

Filename

1653068