Robust Statistical Multi-line TRL Calibration Approach for Microwave Device Characterization

This communication shows the features and comparisons of several robust statistical techniques applied to enhance the TRL calibration algorithm for S-parameters measurements using vector network analyzers. The use of several lines allows the reduction of the noise in the measurements and an appreciable increase in the frequency bandwidth of the TRL application. The Huber estimator is proposed to enhance the reduction of the random errors effects in the calibration process. Simulation and experimental measurements has been carried out to assess the validity of the proposed methodology