• DocumentCode
    2251414
  • Title

    Synchrotron radiation micro lithography and etching (SMILE) for MEMS fabrication

  • Author

    Sugiyama, S.

  • Author_Institution
    Res. Inst. for Micro Syst. Technol., Ritsumeikan Univ., Shiga, Japan
  • fYear
    2001
  • fDate
    Oct. 31 2001-Nov. 2 2001
  • Firstpage
    264
  • Lastpage
    265
  • Abstract
    High aspect ratio microstructure technology (HARMST) is an important technology in order to realize 3-D MEMS. Fine scale HARMST enables processing on a sub-micron scale. If this process is made practicable, application of MEMS can be extended to the optical wavelength region. We are studying two approaches of HARMST using synchrotron radiation microlithography and etching (SMILE) techniques.
  • Keywords
    LIGA; etching; micromachining; micromechanical devices; 3-D MEMS; HARMST; LIGA; MEMS fabrication; PMMA microstructures; SMILE techniques; TIEGA; etching; high aspect ratio microstructure technology; micromachining; synchrotron radiation microlithography; teflon included etching galvanic forming; Etching; Fabrication; Lithography; Manufacturing industries; Manufacturing processes; Micromachining; Micromechanical devices; Microstructure; Optical surface waves; Synchrotron radiation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2001 International
  • Conference_Location
    Shimane, Japan
  • Print_ISBN
    4-89114-017-8
  • Type

    conf

  • DOI
    10.1109/IMNC.2001.984190
  • Filename
    984190