• DocumentCode
    2251663
  • Title

    Structure and resonant characteristics of amorphous carbon pillars grown by FIB-CVD

  • Author

    Fujita, J. ; Ishida, M. ; Ichihashi, T. ; Sakamoto, T. ; Ochiai, Y. ; Kaito, T. ; Matsui, S.

  • Author_Institution
    Fundamental Res. Labs., NEC Corp., Tsukuba, Japan
  • fYear
    2001
  • fDate
    Oct. 31 2001-Nov. 2 2001
  • Firstpage
    284
  • Lastpage
    285
  • Abstract
    Beam induced deposition is a superior technique for nano-fabrication and nano-mechanics that allows many degrees of freedom, so that any shape can be grown at any position with nanometer accuracy. We have already reported the three-dimensional growth of amorphous carbon, having a nanostructure of wineglass, coils, and bellows, using precursor of phenanthrene gas and a focused Ga+ ion beam (FIB) induced chemical vapor deposition (CVD). High-precision Ga-ion beams controlled by highly stabilized ion optics in an FIB system (SM15020, SEIKO Instruments) enabled not only normal growth of carbon nano-pillars on substrate, but also lateral growth. In this paper, we report an evaluation of the Young´s modulus of such amorphous carbon pillars by measuring the resonant frequency of pillars Many improvements are needed in our experimental conditions to clearly define the growth condition. However, the very large Young´s modulus and the flexibility of the nano-structure fabrication in FIB-CVD holds great possibility for future applications of these DLC pillars grown by FIB-CVD.
  • Keywords
    Young´s modulus; amorphous semiconductors; carbon; chemical vapour deposition; elemental semiconductors; focused ion beam technology; micromechanical devices; nanotechnology; C; FIB-CVD; Young´s modulus; amorphous carbon pillars; beam induced deposition; nanofabrication; nanomechanics; resonant characteristics; Amorphous materials; Bellows; Chemical vapor deposition; Coils; Control systems; Ion beams; Optical control; Particle beam optics; Resonance; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2001 International
  • Conference_Location
    Shimane, Japan
  • Print_ISBN
    4-89114-017-8
  • Type

    conf

  • DOI
    10.1109/IMNC.2001.984200
  • Filename
    984200