• DocumentCode
    2251668
  • Title

    A time-domain diagnostic method for emission measurements in TEM cells

  • Author

    Klingler, M. ; Rioult, J. ; Ghys, J.-P.

  • Author_Institution
    INRETS-LEOST, Villeneuve d´´Ascq, France
  • Volume
    2
  • fYear
    2002
  • fDate
    19-23 Aug. 2002
  • Firstpage
    583
  • Abstract
    Emission testing techniques using TEM cells are currently based on power measurements at their port(s) in the frequency-domain. Spectrum measurements do not give directly phase information and therefore only offer partial information on the electromagnetic emission of an equipment under test (EUT) such as the total radiated power. This drawback often leads to difficulties in interpreting the emission results in order to determine precisely the origins of radiation within the EUT and to improve it´s design. This paper presents a new diagnostic method based on time-domain emission measurements using TEM cells in order to determine the origins of radiation within an EUT Unlike spectrum measurements, time-domain measurements can offer full information on radiation, and by correlation with the known currents in the EUT, can help pin-pointing the contributors within the EUT responsible of the highest emission levels.
  • Keywords
    TEM cells; electromagnetic compatibility; electromagnetic interference; time-domain analysis; EMC; EMI; TEM cells; emission measurements; emission testing techniques; equipment under test; power measurements; time-domain diagnostic method; Conductors; Current measurement; Electromagnetic radiation; Frequency domain analysis; Frequency measurement; Open area test sites; Power measurement; TEM cells; Testing; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
  • Conference_Location
    Minneapolis, MN, USA
  • Print_ISBN
    0-7803-7264-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.2002.1032656
  • Filename
    1032656