Field extraction from near field scanning for a microstrip structure

Author

Zhang, Lin ; Slattery, Kevin P. ; Wang, Chen ; Yamaguchi, Masahiro ; Arai, Ken-lchi ; Dubroff, Richard E. ; Drewnial, J.L. ; Pommerenke, David ; Hubing, Todd

Author_Institution

Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO, USA

Volume

2

fYear

2002

fDate

19-23 Aug. 2002

Firstpage

589

Abstract

Currents associated with high-speed digital devices have significant impacts on EMI problems in VLSI design and operation. In this paper, a simple transmission line model was implemented as an initial step to represent the EMI mechanisms associated with an IC package. Numerical modeling results were compared with near field scanning measurements and show that the magnetic field deduced from the measurements agrees well with the numerical predictions.

Keywords

VLSI; electromagnetic compatibility; electromagnetic interference; integrated circuit modelling; integrated circuit packaging; integrated circuit testing; magnetic fields; microstrip lines; transmission line theory; EMI mechanisms; EMI problems; IC package; VLSI design; VLSI operation; high-speed digital devices; magnetic field; microstrip structure; near field scanning measurements; numerical modeling; transmission line model; Coordinate measuring machines; Finite difference methods; Frequency measurement; Integrated circuit modeling; Magnetic field measurement; Microstrip; Numerical models; Predictive models; Time domain analysis; Transmission line measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on

Conference_Location

Minneapolis, MN, USA

Print_ISBN

0-7803-7264-6

Type

conf

DOI

10.1109/ISEMC.2002.1032657

Filename

1032657