Title :
Field extraction from near field scanning for a microstrip structure
Author :
Zhang, Lin ; Slattery, Kevin P. ; Wang, Chen ; Yamaguchi, Masahiro ; Arai, Ken-lchi ; Dubroff, Richard E. ; Drewnial, J.L. ; Pommerenke, David ; Hubing, Todd
Author_Institution :
Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO, USA
Abstract :
Currents associated with high-speed digital devices have significant impacts on EMI problems in VLSI design and operation. In this paper, a simple transmission line model was implemented as an initial step to represent the EMI mechanisms associated with an IC package. Numerical modeling results were compared with near field scanning measurements and show that the magnetic field deduced from the measurements agrees well with the numerical predictions.
Keywords :
VLSI; electromagnetic compatibility; electromagnetic interference; integrated circuit modelling; integrated circuit packaging; integrated circuit testing; magnetic fields; microstrip lines; transmission line theory; EMI mechanisms; EMI problems; IC package; VLSI design; VLSI operation; high-speed digital devices; magnetic field; microstrip structure; near field scanning measurements; numerical modeling; transmission line model; Coordinate measuring machines; Finite difference methods; Frequency measurement; Integrated circuit modeling; Magnetic field measurement; Microstrip; Numerical models; Predictive models; Time domain analysis; Transmission line measurements;
Conference_Titel :
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7264-6
DOI :
10.1109/ISEMC.2002.1032657
