DocumentCode :
2251924
Title :
157 nm lithography for 70 nm technology node
Author :
Itani, T.
Author_Institution :
Semicond. Leading Edge Technol. Inc., Yokohama, Japan
fYear :
2001
fDate :
Oct. 31 2001-Nov. 2 2001
Firstpage :
306
Lastpage :
307
Abstract :
157 nm lithography is the most promising technology for 70 nm technology node of semiconductor devices. Many efforts have been reported on the exposure tool, the laser, the resist materials, the resist processing and the mask materials. In this article, we have demonstrated our recent evaluation results of the exposure tool, the resist materials and processing and the mask materials.
Keywords :
masks; photoresists; ultraviolet lithography; 157 nm; 70 nm; VUV lithography; exposure tool; mask material; resist material; resist processing; semiconductor device manufacturing; Lenses; Lithography; Optical films; Optical imaging; Optical materials; Resists; Semiconductor devices; Semiconductor films; Semiconductor lasers; Semiconductor materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2001 International
Conference_Location :
Shimane, Japan
Print_ISBN :
4-89114-017-8
Type :
conf
DOI :
10.1109/IMNC.2001.984211
Filename :
984211
Link To Document :
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