• DocumentCode
    2252095
  • Title

    Continuum-regime field charging in an electron swarm

  • Author

    Clements, J.S. ; Yu, K.

  • Author_Institution
    Dept. of Phys. & Astron., Appalachian State Univ., Boone, NC, USA
  • fYear
    1990
  • fDate
    7-12 Oct. 1990
  • Firstpage
    766
  • Abstract
    Free electron field charging of particles in nonelectronegative gases was measured as a function of: (1) the applied electric field strength (from 0.25 to 4.82 kV/cm); (2) the particle radius (from 0.22 to 0.91 cm); (3) the charging current (from 1.5 to 80 mu A); and (4) the exposure time (from 1.0 to 4.0 ms, and also 5 s). The measured free-electron saturation charge values strongly support the hypothesis that electron field charging has the same saturation charge limit as ionic field charging. The electron field charging rate measurements support the following hypothesis. If the charge carrier number density is kept constant, the characteristic charging time ( tau ) is inversely proportional to the mobility of the carrier. If the charging current density is constant, then tau is independent of the mobility of the carrier (for the same E). The free electron particle charging results strongly suggest that ionic field charging theory adequately describes the field charging of particles by free electrons if the high mobility of the electrons is taken into account.<>
  • Keywords
    carrier lifetime; carrier mobility; electric charge; electric fields; 0.22 to 0.91 cm; 1 to 4 ms; 1.5 to 80 muA; 5 s; charge carrier; continuum regime; electric field strength; electron swarm; electrostatics; free electron particle charging; mobility; nonelectronegative gases; saturation charge; Charge carriers; Charge measurement; Current density; Current measurement; Electric variables measurement; Electron mobility; Gases; Particle charging; Particle measurements; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 1990., Conference Record of the 1990 IEEE
  • Conference_Location
    Seattle, WA, USA
  • Print_ISBN
    0-87942-553-9
  • Type

    conf

  • DOI
    10.1109/IAS.1990.152272
  • Filename
    152272