• DocumentCode
    2252164
  • Title

    Finnish safety and EMC market surveillance statistics

  • Author

    Rajamäki, Jyri

  • Author_Institution
    Safety Technol. Authority, Helsinki, Finland
  • Volume
    2
  • fYear
    2002
  • fDate
    19-23 Aug. 2002
  • Firstpage
    686
  • Abstract
    In Finland, electrical safety and EMC market surveillance activities have been collected together in the TUVA database, which contains information on over 10000 cases. In this paper, the TUVA database is statistically analyzed. The aim of this paper is to ascertain whether there is a potential use and usefulness for the application of these statistics when evaluating the effectiveness of the Finnish market surveillance of electrical equipment, and also, when in allocating market surveillance resources. The publishing of our statistical information will hopefully assist other market surveillance authorities, as well as entrepreneurs in their operations. The matters researched in this paper are the distribution of market surveillance findings with regards to (1) annual statistics and (2) different product categories. The analysis of safety and EMC findings has been carried out independently and then any potential correlation between results has been checked. Also, the durations of typical market surveillance cases over the period 1994-2000 have been analyzed.
  • Keywords
    database management systems; electrical engineering computing; electromagnetic compatibility; safety; statistical analysis; EMC market surveillance; Finland; TUVA database; annual statistics; electrical equipment; electrical safety; market surveillance authorities; market surveillance resources allocation; product categories; safety analysis; statistical information; Databases; Electrical products; Electrical safety; Electromagnetic compatibility; Manufacturing; Marketing and sales; Product safety; Statistics; Surveillance; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
  • Conference_Location
    Minneapolis, MN, USA
  • Print_ISBN
    0-7803-7264-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.2002.1032675
  • Filename
    1032675