Title :
Experimental characterization and numerical modeling approach of meander delay lines
Author :
Sudo, Toshio ; Kudo, Junichi ; Ko, Yakushi ; Ito, Kenji
Author_Institution :
Corporate Manuf. Eng. Center, Toshiba Corp., Yokohama, Japan
Abstract :
This paper reports experimental characterization of meander lines with different segment lengths and different pitches in two signal line structures: a microstrip line structure and a stripline structure. TDR measurement results showed that larger discontinuities were observed for the microstrip line structure than that for the stripline structure. TDT measurement results showed slightly faster propagation delay for the tightly coupled meander lines for both signal structures. S-parameter measurement showed the stop band in the microstrip line structure. However, it is found that such stop bands were not observed in the stripline structure. Pulse transmission property also showed larger signal distortion for the tightly coupled meander line at 1 GHz. Furthermore, numerical modeling of meander line was executed by using a commercial code of FDTD. It is founded that electromagnetic radiation occurs at the stop band due to the halfwave resonance of the coupled segment length of the microstrip meander line.
Keywords :
delay lines; electromagnetic wave propagation; finite difference time-domain analysis; microstrip lines; printed circuits; 1 GHz; FDTD; S-parameter measurement; TDR measurement; TDT measurement; coupled segment length; electromagnetic radiation; faster propagation delay; halfwave resonance; meander delay lines; microstrip line structure; microstrip meander line; numerical modeling; numerical modeling approach; printed circuits; pulse transmission property; signal distortion; signal line structures; stop band; stripline structure; tightly coupled meander lines; Couplings; Delay lines; Distortion measurement; Finite difference methods; Microstrip; Numerical models; Propagation delay; Scattering parameters; Stripline; Time domain analysis;
Conference_Titel :
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7264-6
DOI :
10.1109/ISEMC.2002.1032680
