Title :
Sequence of events during the catastrophic optical damage in broad-area lasers
Author :
Hempel, M. ; Tomm, J.W. ; Elsaesser, T.
Author_Institution :
Max-Born-Inst., Berlin, Germany
Abstract :
Kinetics of catastrophic optical damage in diode lasers is monitored for 650, 808, and 980 nm emitting devices. The power-decay time-constants after degradation increase with wavelength pinpointing the better thermal properties of 980 nm barrier/waveguide materials.
Keywords :
semiconductor lasers; thermo-optical effects; broad-area lasers; catastrophic optical damage; diode lasers; power-decay time-constants; thermal properties; wavelength 650 nm; wavelength 808 nm; wavelength 980 nm; Diode lasers; Laser theory; Materials; Optical pulses; Physics; Semiconductor lasers; Stimulated emission;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
