Title :
Induced currents on an EUT in a free-space and a modified TEM cell environment
Author :
Fornberg, Per E. ; Holloway, Christopher L. ; Wilson, Perry F.
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Abstract :
The finite-difference time-domain (FDTD) method is used to investigate whether the currents induced on an equipment under test (EUT) in a TEM cell are similar to those induced in an ideal free-space environment. The approach is to simulate an identical EUT in both environments and determine a correlation based on the respective current distributions. The effect of the EUT size relative to the TEM cell as compared to free space is also investigated.
Keywords :
TEM cells; electromagnetic compatibility; electromagnetic induction; finite difference time-domain analysis; immunity testing; EUT; FDTD method; current distributions; finite-difference time-domain method; free-space; induced currents; modified TEM cell environment; numerical simulation; transverse electromagnetic- cell; Apertures; Computational modeling; Electromagnetic scattering; Finite difference methods; NIST; Numerical simulation; Probes; TEM cells; Testing; Time domain analysis;
Conference_Titel :
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7264-6
DOI :
10.1109/ISEMC.2002.1032701
