• DocumentCode
    2252681
  • Title

    Induced currents on an EUT in a free-space and a modified TEM cell environment

  • Author

    Fornberg, Per E. ; Holloway, Christopher L. ; Wilson, Perry F.

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • Volume
    2
  • fYear
    2002
  • fDate
    19-23 Aug. 2002
  • Firstpage
    821
  • Abstract
    The finite-difference time-domain (FDTD) method is used to investigate whether the currents induced on an equipment under test (EUT) in a TEM cell are similar to those induced in an ideal free-space environment. The approach is to simulate an identical EUT in both environments and determine a correlation based on the respective current distributions. The effect of the EUT size relative to the TEM cell as compared to free space is also investigated.
  • Keywords
    TEM cells; electromagnetic compatibility; electromagnetic induction; finite difference time-domain analysis; immunity testing; EUT; FDTD method; current distributions; finite-difference time-domain method; free-space; induced currents; modified TEM cell environment; numerical simulation; transverse electromagnetic- cell; Apertures; Computational modeling; Electromagnetic scattering; Finite difference methods; NIST; Numerical simulation; Probes; TEM cells; Testing; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
  • Conference_Location
    Minneapolis, MN, USA
  • Print_ISBN
    0-7803-7264-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.2002.1032701
  • Filename
    1032701
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2252681