Title :
A time-domain approach to extract SPICE-compatible equivalent models for embedded interconnects
Author :
Chang, Hsiao-Chen ; Kuo, Chun-Chin ; Wu, Tzong-Lin
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Abstract :
This paper proposes an efficient algorithm for extracting SPICE-compatible circuits of embedded interconnect structures from FDTD-simulated time-domain reflections. A layer-peeling technique (LPT) is first employed to de-embed the interconnect-under-extract (IUE) and obtain the time-domain response of the IUE itself. A general pencil of matrix method (GPOM) is then used to get the pole-residue representation of the time-domain response of the IUE. A pole-reducing procedure is implemented based on a bandwidth criterion to obtain another pole-residue representation with minimum poles. Finally, the lumped equivalent models of the IUE are synthesized by an equivalent lumped-model extraction technique, in which four types of equivalent model bases are used. The equivalent circuit can be easily implemented in a SPICE-like simulator. A bonding wire structure and a multiple discontinuous microstrip line are presented as an example to demonstrate the validity of the proposed algorithm both in time and frequency domains.
Keywords :
equivalent circuits; finite difference time-domain analysis; integrated circuit interconnections; interconnections; lead bonding; microstrip lines; printed circuits; time-domain analysis; FDTD; FDTD-simulated time-domain reflections; SPICE-compatible circuits; SPICE-like model; SPICE-like simulator; bonding wire structure; embedded interconnects; equivalent circuit; equivalent lumped-model extraction technique; equivalent model bases; equivalent models; general pencil of matrix method; layer peeling technique; lumped equivalent models; multiple discontinuous microstrip line; pole-residue representation; time-domain approach; time-domain response; Bandwidth; Bonding; Circuit simulation; Circuit synthesis; Equivalent circuits; Integrated circuit interconnections; Reflection; Time domain analysis; Transmission line matrix methods; Wire;
Conference_Titel :
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7264-6
DOI :
10.1109/ISEMC.2002.1032704