DocumentCode :
2252816
Title :
LEd-SpEC: Spectroscopic detection of water contaminants using glow discharges from liquid microelectrodes
Author :
Wilson, C.G. ; Gianchandani, Y.B.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
fYear :
2002
fDate :
24-24 Jan. 2002
Firstpage :
248
Lastpage :
251
Abstract :
This paper reports on the detection of trace contaminants in water by spectroscopy of micro glow discharges that operate in air using liquid electrodes. A liquid electrode spectral emission chip (LEd-SpEC) has been developed to perform this function. Liquid from the cathode is sputtered into the discharge, and can be utilized for spectroscopic detection of impurities. Using a commercial spectrometer, we can measure Na concentrations <10 ppm (mg/l), and lead concentrations of 5 ppm. The relative intensity of certain spectral lines is shown to be a suitable measure of impurity concentration over several orders of magnitude. It is also shown that the addition of acids to lower the pH of the liquid solution increases the sensitivity of impurity detection. This device can also be used as a customizable optical source for UV and visible wavelengths.
Keywords :
glow discharges; impurity distribution; microelectrodes; spectrochemical analysis; spectroscopic light sources; water pollution measurement; LEd-SpEC; Na concentration measurement; Pb concentration measurement; acid addition; customizable optical source; impurity concentration; impurity detection sensitivity; liquid electrode spectral emission chip; liquid microelectrodes; liquid solution pH; micro glow discharges; spectroscopic detection; trace contaminant detection; water contaminants; Cathodes; Electrodes; Glow discharges; Impurities; Optical devices; Optical sensors; Pollution measurement; Semiconductor device measurement; Spectroscopy; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2002. The Fifteenth IEEE International Conference on
Conference_Location :
Las Vegas, NV, USA
ISSN :
1084-6999
Print_ISBN :
0-7803-7185-2
Type :
conf
DOI :
10.1109/MEMSYS.2002.984249
Filename :
984249
Link To Document :
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