DocumentCode :
2252830
Title :
Automatic Test Data Generation Based on SA-QGA
Author :
Ji, Haijing ; Sun, Junmei
Author_Institution :
Sch. of Inf. Sci. & Eng., Hangzhou Normal Univ., Hangzhou, China
fYear :
2012
fDate :
May 30 2012-June 1 2012
Firstpage :
611
Lastpage :
615
Abstract :
Recently, genetic algorithm and their evolutionary algorithms are widely used on automatic test data generation, but they have many problems such as local optimum, premature convergence and being difficult to find global optimum. This paper proposes a new algorithm: SA-QGA (simulated annealing - quantum generate algorithm), and introduces the Boltzmann mechanism of SA into B_QGA (QGA based on Boltzmann selection mechanism). The SA-QGA is used to generate test data with the excellent computing and global search performance of QGA and local search capability of SA. The experiment result verifies that SA-QGA has good performance on test data generation.
Keywords :
automatic test pattern generation; genetic algorithms; program testing; search problems; simulated annealing; Boltzmann selection mechanism; SA-QGA; automatic test data generation; evolutionary algorithms; genetic algorithm; global optimum; global search performance; local search capability; quantum generate algorithm; simulated annealing; Algorithm design and analysis; Biological cells; Convergence; Genetic algorithms; Logic gates; Simulated annealing; Software algorithms; automaticgeneration of test data; genetic algorithm (GA); path test; quantum genetic algorithm (QGA); simulated annealing (SA);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer and Information Science (ICIS), 2012 IEEE/ACIS 11th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-1536-4
Type :
conf
DOI :
10.1109/ICIS.2012.37
Filename :
6211161
Link To Document :
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