• DocumentCode
    2252849
  • Title

    Reduction of crosstalk noise between interconnect lines in CMOS RF integrated circuits

  • Author

    Ootera, H. ; Nishikawa, K. ; Yamakawa, S. ; Oomori, T. ; Tanabe, S.

  • Author_Institution
    Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Hyogo, Japan
  • Volume
    2
  • fYear
    2002
  • fDate
    19-23 Aug. 2002
  • Firstpage
    866
  • Abstract
    We have numerically investigated crosstalk noise between interconnect lines in CMOS RF integrated circuits. Immersed microstrip line (IMSL) and immersed coplanar waveguide (ICPW) over Si substrate were analyzed to make clear shielding effect of grounded planes to reduce crosstalk noise between parallel interconnect lines. It was shown that the crosstalk between the interconnect lines were extensively reduced by the use of IMSLs or ICPWs, compared with simple lines. However, in layout designs using ICPWs, we need consideration about the transmission loss due to the electromagnetic coupling with the lossy Si substrate. On the other hand, for IMSL configurations, the transmission loss due to the Si substrate is small, because the ground plane shields the signal line from the electromagnetic coupling with the Si substrate.
  • Keywords
    CMOS integrated circuits; absorbing media; coplanar waveguides; crosstalk; electromagnetic shielding; elemental semiconductors; integrated circuit interconnections; interference suppression; losses; microstrip lines; silicon; substrates; CMOS RF integrated circuits; Si; Si substrate; crosstalk noise reduction; electromagnetic coupling; grounded planes; immersed coplanar waveguide; immersed microstrip line; interconnect lines; layout designs; lossy Si substrate; parallel interconnect lines; shielding effect; transmission loss; CMOS integrated circuits; Crosstalk; Electromagnetic coupling; Electromagnetic waveguides; Integrated circuit interconnections; Integrated circuit noise; Microstrip; Propagation losses; Radio frequency; Radiofrequency integrated circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
  • Conference_Location
    Minneapolis, MN, USA
  • Print_ISBN
    0-7803-7264-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.2002.1032710
  • Filename
    1032710