Title :
Fuzzy pattern matching with adaptive bin width histograms to maximize classification performances
Author :
Mouchaweh, Moamar Sayed ; Billaudel, Patrice ; Riera, Bemard
Author_Institution :
Autom. Control & Micro Electron. Laboratory, Reims Champagne Ardennes Univ., France
Abstract :
Fuzzy pattern matching is a supervised classification method, which uses histograms to generate membership functions. The classification performances increase with the separability between classes. We propose to use histograms with adaptive bin width according to the dispersion of learning samples in each class. The goal is to increase the separability between classes and to reduce the classification time. The efficacy of this method is tested in using several real examples.
Keywords :
fuzzy set theory; pattern classification; pattern matching; adaptive bin width histograms; fuzzy pattern matching; supervised classification method; Automatic generation control; Data acquisition; Decision making; Fuzzy sets; Histograms; Laboratories; Pattern matching; Pattern recognition; Probability density function; Testing;
Conference_Titel :
Fuzzy Systems, 2004. Proceedings. 2004 IEEE International Conference on
Print_ISBN :
0-7803-8353-2
DOI :
10.1109/FUZZY.2004.1375729