Title :
Automatic detection of wheat flour precision based on image processing
Author :
Liu Yan Li ; Mei, Zhang Hong ; Tie, Wang Jian
Author_Institution :
Dept. of Inf. Sci. & Technol., Henan Univ. of Technol., Zhengzhou, China
Abstract :
In order to efficient, objective and comprehensive assessment of wheat flour processing accuracy, this paper introduces a new method to detect the wheat flour processing precision; it uses wheat flour three features of Whiteness, color, bran to design classifiers. The 240 different accuracy wheat sample images were analyzed and tested, experimental results show that CIE L*a*b*and OTSU algorithm can effectively extract of wheat color features and content of bran, classifier also achieves the expected effect.
Keywords :
feature extraction; image processing; OTSU algorithm; ant colony algorithm; color features; image processing; wheat flour precision automatic detection; Brightness; Feature extraction; Image color analysis; Image converters; Image processing; Information science; Pixel; Robotics and automation; Testing; Zinc; ant colony algorithm; color feature; fuzzy Cmeans; fuzzy recognition;
Conference_Titel :
Informatics in Control, Automation and Robotics (CAR), 2010 2nd International Asia Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-5192-0
Electronic_ISBN :
1948-3414
DOI :
10.1109/CAR.2010.5456881