Title :
High resolution spectral characterization of Betatron X-ray radiation
Author :
Albert, Felicie ; Phuoc, Kim Ta ; Shah, Rahul ; Fitour, Romuald ; Burgy, Frederic ; Tafzi, Amar ; Douillet, Denis ; Lefrou, Thierry ; Rousse, Antoine
Author_Institution :
LOA-ENSTA-Ecole Polytech., CNRS, Palaiseau
Abstract :
We present the first detailed spectral measurement of 1-3 keV Betatron X-ray radiation with two high resolution crystal spectrometers. Electron trajectories in the laser produced plasma can be determined with this measurement.
Keywords :
plasma X-ray sources; plasma diagnostics; plasma light propagation; Betatron X-ray radiation; crystal spectrometers; electron trajectories; electron volt energy 1 keV to 3 keV; hard X-ray source; high resolution spectral characterization; laser produced plasma; laser-plasma interaction; Chemical lasers; Electrons; Plasma measurements; Plasma properties; Plasma sources; Plasma x-ray sources; Spectroscopy; X-ray diffraction; X-ray imaging; X-ray lasers;
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
