Title :
Relativistic photoelectron measurements from ionization of argon and xenon in ultrahigh fields
Author :
Ghebregziabher, I. ; DiChiara, A. ; Palaniyappan, S. ; Sauer, R. ; Mitchel, R. ; Waesche, J. ; White, S. ; Waker, B.C.
Author_Institution :
Dept. of Phys. & Astron., Univ. of Delaware, Newark, DE
Abstract :
Photoelectron angular distributions with energies as high as 1 MeV were measured and calculated with a semi-classical tunneling model at relativistic laser intensity. Measurements and theory show directional higher energy electrons and isotropic lower energy electrons.
Keywords :
argon; ionisation; photoelectron spectra; tunnelling; xenon; Ar; Xe; argon; electron volt energy 1 MeV; ionization; photoelectron angular distributions; relativistic laser intensity; semi-classical tunneling model; ultrahigh fields; xenon; Argon; Atomic beams; Energy measurement; Extraterrestrial measurements; Free electron lasers; Ionization; Laser modes; Laser theory; Pulse amplifiers; Xenon; (020.2649); (320.7120);
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
