DocumentCode
2253298
Title
Temperature control of CMOS micromachined sensors
Author
Lakdawala, H. ; Fedder, G.K.
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
2002
fDate
24-24 Jan. 2002
Firstpage
324
Lastpage
327
Abstract
In this paper, we describe a methodology for temperature stabilization of CMOS micromachined sensors. Temperature stabilization of a z-axis accelerometer, fabricated in a 0.5 /spl mu/m Agilent CMOS process is demonstrated. The accelerometer motion is sensed by a vertical comb drive designed by controlling the rotor and stator curvature. The polysilicon layer of the CMOS process has been utilized for heating the device structure to a constant temperature, that is higher than the maximum ambient operating temperature. The capacitance detection circuits have temperature independent gain. The D.C. bias stability of the accelerometer improved from 1.9 G//spl deg/C, to 42 mG//spl deg/C, and the sensitivity stability improved from 60% to 18% over a temperature of 70/spl deg/C after temperature control.
Keywords
CMOS integrated circuits; accelerometers; capacitive sensors; compensation; microsensors; temperature control; 0.5 micron; Agilent CMOS process; CMOS micromachined sensors; DC bias stability; accelerometer motion; capacitance detection circuits; integrated heater design; polysilicon layer; rotor curvature control; sensitivity stability; stator curvature control; temperature control; temperature independent gain; temperature stabilization methodology; vertical comb drive; z-axis accelerometer; Accelerometers; CMOS process; Capacitance; Circuit stability; Heating; Motion control; Sensor phenomena and characterization; Stators; Temperature control; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2002. The Fifteenth IEEE International Conference on
Conference_Location
Las Vegas, NV, USA
ISSN
1084-6999
Print_ISBN
0-7803-7185-2
Type
conf
DOI
10.1109/MEMSYS.2002.984268
Filename
984268
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