• DocumentCode
    2253430
  • Title

    Far Correlation-based EMA with a precharacterized leakage model

  • Author

    Meynard, Olivier ; Guilley, Sylvain ; Danger, Jean-Luc ; Sauvage, Laurent

  • Author_Institution
    Inst. TELECOM, TELECOM ParisTech, Paris, France
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    977
  • Lastpage
    980
  • Abstract
    Electromagnetic analysis is an important class of attacks against cryptographic devices. In this article, we prove that Correlation-based on ElectroMagnetic Analysis (CEMA) on a hardware-based high-performance AES module is possible from a distance as far as 50 cm. First we show that the signal-to-noise ratio (SNR) tends to a non-zero limit when moving the antenna away from the cryptographic device. An analysis of the leakage structure shows that the Hamming distance model, although suitable for small distances gets more and more distorted when the antenna is displaced far from the device. As we cannot devise any physical model that would predict the observations, we instead pre-characterized it using a first order templates construction. With this model, we enhanced the CEMA by a factor up to ten. Therefore, we conclude that EMA at large distance is feasible with our amplification strategy coupled to an innovative training phase aiming at precharacterizing accurate coefficients of a parametric weighted distance leakage model.
  • Keywords
    correlation theory; cryptography; CEMA; Hamming distance model; SNR; correlation based on electromagnetic analysis; cryptographic devices; far correlation based EMA; precharacterized leakage model; signal-to-noise ratio; Clocks; Cryptography; Dissolved gas analysis; Electromagnetic analysis; Electromagnetic radiation; Hardware; Plastics; Power supplies; Signal to noise ratio; Telecommunications; Correlation EMA (CEMA); ElectroMagnetic Analysis (EMA); Leakage model; Side-Channel Attacks (SCA); Template estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5456906
  • Filename
    5456906