DocumentCode
2253430
Title
Far Correlation-based EMA with a precharacterized leakage model
Author
Meynard, Olivier ; Guilley, Sylvain ; Danger, Jean-Luc ; Sauvage, Laurent
Author_Institution
Inst. TELECOM, TELECOM ParisTech, Paris, France
fYear
2010
fDate
8-12 March 2010
Firstpage
977
Lastpage
980
Abstract
Electromagnetic analysis is an important class of attacks against cryptographic devices. In this article, we prove that Correlation-based on ElectroMagnetic Analysis (CEMA) on a hardware-based high-performance AES module is possible from a distance as far as 50 cm. First we show that the signal-to-noise ratio (SNR) tends to a non-zero limit when moving the antenna away from the cryptographic device. An analysis of the leakage structure shows that the Hamming distance model, although suitable for small distances gets more and more distorted when the antenna is displaced far from the device. As we cannot devise any physical model that would predict the observations, we instead pre-characterized it using a first order templates construction. With this model, we enhanced the CEMA by a factor up to ten. Therefore, we conclude that EMA at large distance is feasible with our amplification strategy coupled to an innovative training phase aiming at precharacterizing accurate coefficients of a parametric weighted distance leakage model.
Keywords
correlation theory; cryptography; CEMA; Hamming distance model; SNR; correlation based on electromagnetic analysis; cryptographic devices; far correlation based EMA; precharacterized leakage model; signal-to-noise ratio; Clocks; Cryptography; Dissolved gas analysis; Electromagnetic analysis; Electromagnetic radiation; Hardware; Plastics; Power supplies; Signal to noise ratio; Telecommunications; Correlation EMA (CEMA); ElectroMagnetic Analysis (EMA); Leakage model; Side-Channel Attacks (SCA); Template estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5456906
Filename
5456906
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