Title :
Processing strategies for high speed 0201 implementation
Author :
Houston, Paul N. ; Bentley, Jesse ; Lewis, Brian J. ; Smith, Brian A. ; Baldwin, Daniel F.
Author_Institution :
Adv. Assembly Technol. Center, Siemens Dematic Electron. Assembly Syst., Norcross, GA, USA
Abstract :
A lot of research has been done to determine the board design considerations for 0201 processing, but work also needs to be done to determine the process window. Initial data presented last year showed a number of significant factors in the printing, placement, and reflow processes. From that study, the individual process steps showed that certain design and manufacturing parameters can have a huge effect upon total process defects. Presented in this paper is the data from those studies as well as the data gathered after a large evaluation run in which many components were processed. Studied process parameters were broken out by individual process steps initially, and then studied over the entire process. Some of the process parameters that were examined were stencil manufacturing method, print force, print speed, and stencil wipe frequency for the printing process and reflow atmosphere, profile shape, and ramp rate for the reflow process. From these studies, a reliable process window was obtained for a high speed 0201 assembly process that was proven to provide a 17 DPM (defect per million) assembly yield.
Keywords :
design of experiments; fault diagnosis; printed circuit design; printed circuit manufacture; printed circuit testing; process control; reflow soldering; surface mount technology; 0201 processing strategies; assembly yield; board design considerations; defects per million; design of experiments; design/manufacturing parameters; high speed 0201 package implementation; individual process steps; package size; passive components; placement; print force; print speed; process evaluation; process window; profile shape; ramp rate; reflow; reflow atmosphere; significant printing process factors; stencil manufacturing method; stencil wipe frequency; total process defects; Assembly systems; Blades; Electronics industry; Electronics packaging; Industrial electronics; Manufacturing processes; Printing; Radio frequency; Shape; Temperature;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2002. IEMT 2002. 27th Annual IEEE/SEMI International
Print_ISBN :
0-7803-7301-4
DOI :
10.1109/IEMT.2002.1032745