Title :
Diffraction into Propagating and Evanescent Modes from a Single Slit: the Slit-width Dependence
Author :
Kihm, H.W. ; Lee, K.G. ; Kim, D.S.
Author_Institution :
Dept. of Phys. & Astron., Seoul Nat. Univ., Seoul
Abstract :
Diffraction from a single slit has been investigated both in the far-field and the near-field. The diffraction in the near-field is dominated by the surface plasmon generation, which shows a striking sinusoidal dependence on the slit-width. In contrast, the far-field transmitted intensity shows linear increase with the slit width.
Keywords :
light diffraction; light propagation; near-field scanning optical microscopy; surface plasmons; ANSOM experiments; NSOM experiments; apertureless near-field scanning optical microscope experiments; evanescent modes; far-field analysis; far-field transmitted intensity; near-field analysis; propagating modes; single slit light diffraction; slit-width dependence; surface plasmon generation; Apertures; Diffraction; Length measurement; Optical microscopy; Optical propagation; Optical scattering; Optical surface waves; Plasmons; Probes; Surface waves;
Conference_Titel :
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1173-3
Electronic_ISBN :
978-1-4244-1174-0
DOI :
10.1109/CLEOPR.2007.4391807
