Title :
Equivalent driver model for fast system simulation
Author :
Feng, June ; Huang, Ching-Chao
Author_Institution :
Rambus Inc.
Keywords :
Circuit simulation; Circuit testing; Clocks; Driver circuits; Mathematical model; Random access memory; Robustness; Runtime; Time domain analysis; Voltage;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2002. IEMT 2002. 27th Annual IEEE/SEMI International
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-7301-4
DOI :
10.1109/IEMT.2002.1032765