Title :
Parallel X-fault simulation with critical path tracing technique
Author :
Ubar, Raimund ; Devadze, Sergei ; Raik, Jaan ; Jutman, Artur
Author_Institution :
Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
Abstract :
In this paper, a new very fast fault simulation method to handle the X-fault model is proposed. The method is based on a two-phase procedure. In the first phase, a parallel exact critical path fault tracing is used to determine all the detected stuck-at faults in the circuit, and in the second phase a postprocess is launched which will determine the detectability of X-faults.
Keywords :
circuit simulation; fault simulation; logic testing; X-fault model; circuit fault detection; parallel X-fault simulation; parallel exact critical path fault tracing; stuck-at fault; two-phase procedure; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Electrical fault detection; Failure analysis; Fault diagnosis; Logic; Solid modeling; X-fault model; digital circuits; fault simulation; parallel exact critical path fault tracing;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
Print_ISBN :
978-1-4244-7054-9
DOI :
10.1109/DATE.2010.5456929
