• DocumentCode
    2254381
  • Title

    Fault-tolerant Ethernet for IP-based process control: A demonstration

  • Author

    Song, S. ; Huang, J. ; Kappler, P. ; Freimark, R. ; Gustin, J. ; Kozlik, T.

  • Author_Institution
    Honeywell Technol. Centre, MN, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    361
  • Lastpage
    366
  • Abstract
    We present an efficient middleware-based fault-tolerant Ethernet (FTE) prototype developed for process control networks. This unique approach requires no change of commercial-off-the-shelf (COTS) hardware (switch, hub, Ethernet physical link and network interface card (NIC)) and software (Ethernet driver and protocol), yet it is transparent to application software. The FTE performs failure detection and recovery for handling multiple points of network failures and supports communications with non FTE-native devices. In this demonstration, we focus on presenting the failure detection and recovery behavior under various failure modes and scenarios. Further, multiple failure handling, node departure and non FTE-native node and FTE node communication scenarios will be presented. The FTE protocol status will be displayed using an FTE user interface on a COTS-based network system
  • Keywords
    Internet; client-server systems; controller area networks; fault tolerant computing; process control; COTS hardware; COTS-based network system; FTE protocol status; FTE prototype; FTE user interface; IP-based process control; commercial-off-the-shelf hardware; commercial-off-the-shelf software; failure detection; failure recovery; middleware-based fault-tolerant ethernet prototype; multiple failure handling; node departure; process control networks; Communication switching; Ethernet networks; Fault tolerance; Hardware; Network interfaces; Process control; Protocols; Prototypes; Software prototyping; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks, 2000. DSN 2000. Proceedings International Conference on
  • Conference_Location
    New York, NY
  • Print_ISBN
    0-7695-0707-7
  • Type

    conf

  • DOI
    10.1109/ICDSN.2000.857561
  • Filename
    857561