• DocumentCode
    2254505
  • Title

    Integrated yield management: a systematic approach to yield management

  • Author

    Effron, Mel

  • Author_Institution
    Yield Manage. Assoc., Burlington, VT, USA
  • fYear
    1996
  • fDate
    12-14 Nov 1996
  • Firstpage
    397
  • Lastpage
    403
  • Abstract
    IYMTM is a systematic approach to yield management developed and refined multiple, highly successful, leading World Class FABs. The power of IYM lies in its ability to focus total enterprise resources for the single purpose of dramatically improving yields. There are six critical components of IYM discussed in this paper: (1) Preproduction Engineering practices to maximize and focus attention an design and probe yields prior to product qualification and production ramp; (2) Systematic, Long Loop analysis for 100% yield lass explanation modeled into partitioned yield owners based upon a targeted limited yields, learning plan; (3) Utilization of critical Short Loop control systems tied to specific inline limited yield targets chosen against Long Loop failure analysis; (4) Amplification and enlargement of the responsibilities of Operators and Maintenance personnel to function as Short Loop Engineers; (5) Application and use of interactive, user friendly, Computer Integrated Manufacturing (CIM) information creation system tied to the enterprise data collection points; (6) Establishment of a micro and macro Critical Area Yield Model to correlate, validate and predict from Short Loop controls their Long Loop results. Being central to the IYM flow, Critical Area
  • Keywords
    computer integrated manufacturing; integrated circuit yield; management; IYM; World Class FABs; computer integrated manufacturing; critical area yield model; integrated yield management; long loop failure analysis; maintenance personnel; operators; preproduction engineering; short loop control system; Computer integrated manufacturing; Data engineering; Design engineering; Failure analysis; Power engineering and energy; Power system management; Predictive models; Probes; Production systems; Qualifications;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1996. ASMC 96 Proceedings. IEEE/SEMI 1996
  • Conference_Location
    Cambridge, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-3371-3
  • Type

    conf

  • DOI
    10.1109/ASMC.1996.558095
  • Filename
    558095