Title :
On component level ESD testing
Author :
Soohoo, Kwok M. ; Wu, Chang-Yu
Author_Institution :
IBM Corp., Poughkeepsie, NY, USA
Abstract :
The ESD test method proposed involves the use of a transverse electromagnetic (TEM) cell and fiber-optic links to eliminate the unwanted electrostatic discharge (ESD) disturbances to the supportive instrumentation. This limits the ESD transient effects to stress only the common subassembly or component under test and therefore produces the proper susceptibility level for use in predicting the final product ESD performance.<>
Keywords :
electrostatic discharge; testing; TEM cell; component level ESD testing; fiber-optic links; supportive instrumentation; susceptibility level; transverse electromagnetic cell; Circuit testing; Costs; Electrostatic discharge; Instruments; Noise level; Noise reduction; Optical fiber testing; Optical fibers; Optical noise; Protection;
Conference_Titel :
Industry Applications Society Annual Meeting, 1990., Conference Record of the 1990 IEEE
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-87942-553-9
DOI :
10.1109/IAS.1990.152286
