DocumentCode :
2255168
Title :
A novel low-loss wafer-level packaging of the RF-MEMS devices
Author :
Yun-Kwon Park ; Heung-Woo Park ; Duck-Jung Lee ; Jung-Ho Park ; In-Sang Song ; Chung-Woo Kim ; Ci-Moo Song ; Yun-Hi Lee ; Chul-Ju Kim ; Byeong Kwon Ju
Author_Institution :
Display & Nano Devices Lab., Korea Inst. of Sci. & Technol., Seoul, South Korea
fYear :
2002
fDate :
24-24 Jan. 2002
Firstpage :
681
Lastpage :
684
Abstract :
In this work, the flip-chip method was used for packaging an RF-MEMS switch on a quartz substrate with low losses. 4-inch Pyrex glass was used as a package substrate and was airblast punched with 250 /spl mu/m diameter holes. A Cr/Au seed layer was deposited on it and the vias were filled by plating with gold. After forming molds on the holes with thick photoresist, bumps were plated on holes. The package substrate was bonded with a quartz substrate using B-stage epoxy. The loss of the overall package structure was tested with a network analyzer and was within -0.05 dB. This structure can be used for wafer level packaging of both RF-MEMS and other MEMS devices.
Keywords :
coplanar waveguides; flip-chip devices; losses; micromechanical devices; microwave switches; plastic packaging; 250 micron; 4 in; Au plating; B-stage epoxy; CPW line; Cr-Au; Cr/Au seed layer; Pyrex glass package substrate; RF-MEMS switch; SiO/sub 2/; airblast punching; bump plating; flip-chip method; low-loss wafer-level packaging; mold forming; network analyzer; quartz substrate; thick photoresist; via filling; Chromium; Glass; Gold; Packaging; Radiofrequency microelectromechanical systems; Resists; Switches; Testing; Wafer bonding; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2002. The Fifteenth IEEE International Conference on
Conference_Location :
Las Vegas, NV, USA
ISSN :
1084-6999
Print_ISBN :
0-7803-7185-2
Type :
conf
DOI :
10.1109/MEMSYS.2002.984362
Filename :
984362
Link To Document :
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