Title :
Reducing the storage requirements of a test sequence by using a background vector
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
We describe a storage scheme for functional test sequences where a test sequence T is associated with a primary input vector B called a background vector. T is stored by storing only the differences between its test vectors and B. We describe a procedure for computing a background vector B for a given test sequence T. We also describe a procedure that modifies T so as to reduce its storage requirements with respect to B. We present experimental results demonstrating that the single background vector B, computed based on T, allows T to be modified such that a vast majority of its entries are equal to the corresponding entries of B. Consequently, storage of T reduces to storage of a small number of entries.
Keywords :
digital storage; logic testing; sequential circuits; background vector; functional test sequences; sequential circuits; storage scheme; Circuit simulation; Circuit testing; Cities and towns; Compaction; Encoding; Genetic mutations; Manufacturing; Sequential analysis; Sequential circuits; Synchronous generators;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
Print_ISBN :
978-1-4244-7054-9
DOI :
10.1109/DATE.2010.5456996