Title :
Behavioral level dual-vth design for reduced leakage power with thermal awareness
Author :
Yu, Junbo ; Zhou, Qiang ; Qu, Gang ; Bian, Jinian
Author_Institution :
Dept. of Comput. Sci., Tsinghua Univ., Beijing, China
Abstract :
Dual-Vth design is an effective leakage power reduction technique at behavioral synthesis level. It allows designers to replace modules on non-critical path with the high-Vth implementation. However, the existing constructive algorithms fail to find the optimal solution due to the complexity of the problem and do not consider the on-chip temperature variation. In this paper, we propose a two-stage thermal-dependent leakage power minimization algorithm by using dual-Vth library during behavioral synthesis. In the first stage, we quantitatively evaluate the timing impact on other modules caused by replacing certain modules with high Vth. Based on this analysis and the characteristics of the dual-Vth module library, we generate a small set of candidate solutions for the module replacement. Then in the second stage, we obtain the on-chip thermal information from thermal-aware floorplanning and thermal analysis to select the final solution from the candidate set. Experimental results show an average of 17.8% saving in leakage power consumption and a slightly shorter runtime compared to the best known work. In most cases, our algorithm can actually find the optimal solutions obtained from a complete solution space exploration.
Keywords :
circuit layout; leakage currents; network synthesis; thermal analysis; behavioral level dual-vth design; behavioral synthesis level; leakage power reduction; noncritical path; on-chip temperature variation; reduced leakage power; thermal analysis; thermal awareness; thermal-aware floorplanning; two-stage thermal-dependent leakage power minimization; Energy consumption; Information analysis; Integrated circuit synthesis; Libraries; Power engineering computing; Temperature dependence; Thermal engineering; Thermal factors; Threshold voltage; Timing; Behavioral Synthesis; Dual-Vth; Leakage Power; Thermal-aware;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
Print_ISBN :
978-1-4244-7054-9
DOI :
10.1109/DATE.2010.5457000