• DocumentCode
    2255357
  • Title

    Behavioral level dual-vth design for reduced leakage power with thermal awareness

  • Author

    Yu, Junbo ; Zhou, Qiang ; Qu, Gang ; Bian, Jinian

  • Author_Institution
    Dept. of Comput. Sci., Tsinghua Univ., Beijing, China
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    1261
  • Lastpage
    1266
  • Abstract
    Dual-Vth design is an effective leakage power reduction technique at behavioral synthesis level. It allows designers to replace modules on non-critical path with the high-Vth implementation. However, the existing constructive algorithms fail to find the optimal solution due to the complexity of the problem and do not consider the on-chip temperature variation. In this paper, we propose a two-stage thermal-dependent leakage power minimization algorithm by using dual-Vth library during behavioral synthesis. In the first stage, we quantitatively evaluate the timing impact on other modules caused by replacing certain modules with high Vth. Based on this analysis and the characteristics of the dual-Vth module library, we generate a small set of candidate solutions for the module replacement. Then in the second stage, we obtain the on-chip thermal information from thermal-aware floorplanning and thermal analysis to select the final solution from the candidate set. Experimental results show an average of 17.8% saving in leakage power consumption and a slightly shorter runtime compared to the best known work. In most cases, our algorithm can actually find the optimal solutions obtained from a complete solution space exploration.
  • Keywords
    circuit layout; leakage currents; network synthesis; thermal analysis; behavioral level dual-vth design; behavioral synthesis level; leakage power reduction; noncritical path; on-chip temperature variation; reduced leakage power; thermal analysis; thermal awareness; thermal-aware floorplanning; two-stage thermal-dependent leakage power minimization; Energy consumption; Information analysis; Integrated circuit synthesis; Libraries; Power engineering computing; Temperature dependence; Thermal engineering; Thermal factors; Threshold voltage; Timing; Behavioral Synthesis; Dual-Vth; Leakage Power; Thermal-aware;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5457000
  • Filename
    5457000