• DocumentCode
    2255457
  • Title

    Exploiting local logic structures to optimize multi-core SoC floorplanning

  • Author

    Li, Cheng Hong ; Sonalkar, Sampada ; Carloni, Luca P.

  • Author_Institution
    Dept. of Comput. Sci., Columbia Univ. in the City of New York, New York, NY, USA
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    1291
  • Lastpage
    1296
  • Abstract
    We present a throughput-driven partitioning algorithm and a throughput-preserving merging algorithm for the high-level physical synthesis of latency-insensitive (LI) systems. These two algorithms are integrated along with a published floorplanner [5] in a new iterative physical synthesis flow to optimize system throughput and reduce area occupation. The partitioning algorithm performs bottom-up clustering of the internal logic of a given IP core to divide it into smaller ones, each of which has no combinational path from input to output and thus is legal for LI-interface encapsulation. Applying this algorithm to cores on critical feedback loops optimizes their length and in turn enables throughput optimization via the subsequent floorplanning. The merging algorithm reduces the number of cores on non-critical loops, lowering the overall area taken by LI interfaces without hurting the system throughput. Experimental results on a large system-on-chip design show a 16.7% speedup in system throughput and a 2.1% reduction in area occupation.
  • Keywords
    circuit layout; encapsulation; optimisation; system-on-chip; IP core; LI interface encapsulation; bottom up clustering; iterative physical synthesis flow; latency insensitive systems; local logic structures; multicore SoC floorplanning optimization; throughput driven partitioning algorithm; throughput preserving merging algorithm; Clustering algorithms; Encapsulation; Feedback loop; Iterative algorithms; Law; Legal factors; Logic; Merging; Partitioning algorithms; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5457005
  • Filename
    5457005