DocumentCode
2255475
Title
Computational intelligence semiconductor ate - ultra-short worst case test
Author
Liau, Eric ; Schmitt-Landsiedel, Doris
fYear
2005
fDate
20-22 July 2005
Firstpage
273
Lastpage
278
Keywords
Circuit simulation; Circuit synthesis; Circuit testing; Computational intelligence; Computer aided software engineering; Genetic algorithms; Neural networks; Semiconductor device testing; Sequential analysis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence for Measurement Systems and Applications, 2005. CIMSA. 2005 IEEE International Conference on
Print_ISBN
0-7803-9026-1
Type
conf
DOI
10.1109/CIMSA.2005.1522877
Filename
1522877
Link To Document