Title :
Computational intelligence semiconductor ate - ultra-short worst case test
Author :
Liau, Eric ; Schmitt-Landsiedel, Doris
Keywords :
Circuit simulation; Circuit synthesis; Circuit testing; Computational intelligence; Computer aided software engineering; Genetic algorithms; Neural networks; Semiconductor device testing; Sequential analysis; System testing;
Conference_Titel :
Computational Intelligence for Measurement Systems and Applications, 2005. CIMSA. 2005 IEEE International Conference on
Print_ISBN :
0-7803-9026-1
DOI :
10.1109/CIMSA.2005.1522877
