• DocumentCode
    2255493
  • Title

    Modeling of electronic transport in metallic carbon nanotube interconnects

  • Author

    Parkash, Vidur ; Goel, Ashok K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Michigan Technol. Univ., Houghton, MI, USA
  • fYear
    2010
  • fDate
    19-22 Dec. 2010
  • Firstpage
    244
  • Lastpage
    247
  • Abstract
    Metallic carbon nanotubes are being considered as a candidate for to potentially replace Copper as an interconnect material in future generation integrated circuits. In this paper we examine electronic transport behavior in metallic carbon nanotubes using a self consistent non equilibrium Green´s function (NEGF) methodolgy including effects of electron phonon interactions Results show that conductivity is seen to decrease in the ballistic limit due to localized disorder effects even with a weak disorder potential. We were also able to show that optical phonons (LO/TO modes) are the dominant mechanisms that govern the mean free path of conduction. Our calculations show an excellent match with experiement.
  • Keywords
    Green´s function methods; carbon nanotubes; electron-phonon interactions; integrated circuit interconnections; C; ballistic limit; conductivity; copper; electron phonon interaction; electronic transport behavior; integrated circuit; interconnect material; localized disorder; metallic carbon nanotube interconnects; non equilibrium Green´s function; optical phonon; weak disorder potential; Carbon nanotubes; nanotechnology; non equilibrium Green´s functions; phonons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics (ICM), 2010 International Conference on
  • Conference_Location
    Cairo
  • Print_ISBN
    978-1-61284-149-6
  • Type

    conf

  • DOI
    10.1109/ICM.2010.5696128
  • Filename
    5696128