Title :
Artificial neural network-based procedure for cryogenic microwave noise characterization of HEMT´s
Author :
Caddemi, A. ; Catalfamo, F. ; Donato, N.
Keywords :
Active noise reduction; Artificial neural networks; Circuit noise; Cryogenics; HEMTs; Microwave devices; Microwave transistors; Noise figure; Noise measurement; Temperature;
Conference_Titel :
Computational Intelligence for Measurement Systems and Applications, 2005. CIMSA. 2005 IEEE International Conference on
Print_ISBN :
0-7803-9026-1
DOI :
10.1109/CIMSA.2005.1522879
