DocumentCode :
2255624
Title :
4H-SiC BJT and Darlington switch for power inverter applications
Author :
Li, X. ; Luo, Y. ; Fursin, L. ; Zhao, J.H. ; Pan, M. ; Alexandrov, P. ; Weiner, M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
fYear :
2001
fDate :
2001
Firstpage :
9
Lastpage :
12
Abstract :
In this paper, the temperature coefficient of 4H-SiC NPN BJT current gain is studied by performing two-dimensional numerical simulations with the ISE SiC TCAD module. It is shown that, depending on the carrier lifetime and base doping level, 4H-SiC NPN BJTs with Al-doped base could have both PTC and NTC. We report the fabrication of a 4H-SiC BJT with an NTC in current gain, a current gain of β=9 and a BVceo of 800 V. We also report the first demonstration of packaged 4H-SiC power BJTs operating in an all-SiC inductively-loaded half-bridge inverter up to 8.8 kW and the first demonstration of a 4H-SiC Darlington switch as well as its performance in an inductively-loaded half-bridge inverter.
Keywords :
DC-AC power convertors; bipolar transistor switches; carrier lifetime; current density; doping profiles; invertors; power bipolar transistors; power semiconductor switches; silicon compounds; wide band gap semiconductors; 4H-SiC BJT; 4H-SiC Darlington switch; 8.8 kW; 800 V; Al-doped base; BJT current gain; ISE SiC TCAD module; NPN BJT; NTC; PTC; SiC; SiC:Al; base doping level; carrier lifetime; fabrication; inductively-loaded half-bridge inverter; negative temperature coefficient; packaged SiC power BJTs; positive temperature coefficient; power inverter applications; two-dimensional numerical simulations; Charge carrier lifetime; Doping; Fabrication; Inverters; Numerical simulation; Packaging; Performance gain; Silicon carbide; Switches; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2001 International
Print_ISBN :
0-7803-7432-0
Type :
conf
DOI :
10.1109/ISDRS.2001.984426
Filename :
984426
Link To Document :
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