DocumentCode :
2256037
Title :
Yield breakpoints between single/multifunction MMICs
Author :
Myers, A.
Author_Institution :
GEC-Marconi Mater. Technol. Ltd., Towcester, UK
fYear :
1997
fDate :
35760
Firstpage :
42614
Lastpage :
42618
Abstract :
It is now nearly a quarter of a century since the first GaAs FET based MMICs were demonstrated. After an initial period of experimentation and development, the medium entered true commercial exploitation in the 1980´s. At that time it was relatively expensive and found first insertion mainly in military systems but it has now found its was into many volume applications. This growth in exploitation has come about through two major causes - improved processing technologies and hence yields, and improved circuit design capability. This paper will attempt to illustrate how the improved yields have allowed circuit designers to produce complex, multifunction MMICs - in some cases, systems on a chip
Keywords :
integrated circuit yield; GaAs; GaAs FET; circuit design; multifunction MMIC; processing technology; single function MMIC; yield;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Design of RFIC's and MMIC's (Ref. No. 1997/391), IEE Tutorial Colloquium on
Conference_Location :
London
Type :
conf
DOI :
10.1049/ic:19971367
Filename :
666532
Link To Document :
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