DocumentCode :
2256066
Title :
Comparitive analysis of machine learning techniques for classification of arbovirus
Author :
Fathima, Shameem A. ; Hundewale, Nisar
Author_Institution :
Coll. of Comput. Sci. & Inf. Technol., Taif Univ., Taif, Saudi Arabia
fYear :
2012
fDate :
5-7 Jan. 2012
Firstpage :
376
Lastpage :
379
Abstract :
This paper studies classification methods, comparing svm and Naïve´s Bayes analysis as applied to viral disease medical data mining. The objective of this study is to explore possibility of applying machine learning techniques such as SVM and Naïve Bayes algorithm for classification to predict the susceptibility for complex disease-Dengue. Both of these algorithms were chosen for their simple, amazing and accurate results. The proposed work is to experiment machine learning algorithms to the available arbovirus that is causing frequent recurrent epidemics. In this paper, we discuss the application of machine learning techniques that make a distinction between dengue and other feverish illnesses in the primary care setting and predict severe arboviral disease among population. By investigating the arboviral dataset from one of the largest outbreaks that affected India in recent times, we master the methodology and validate classification performance as a measurement of the salience for the discovered associations. The result of the comparison between the methods showed that SVM outperforms the Naïve Bayes in Dengue disease diagnosis.
Keywords :
Bayes methods; data mining; diseases; learning (artificial intelligence); medical computing; microorganisms; pattern classification; support vector machines; Naïve´s Bayes analysis; SVM; arbovirus classification; comparitive analysis; complex disease dengue; machine learning techniques; viral disease medical data mining; Accuracy; Classification algorithms; Electronic publishing; Information services; Internet; Laboratories; Support vector machines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical and Health Informatics (BHI), 2012 IEEE-EMBS International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4577-2176-2
Electronic_ISBN :
978-1-4577-2175-5
Type :
conf
DOI :
10.1109/BHI.2012.6211593
Filename :
6211593
Link To Document :
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