Title :
Domain specific architecture for next generation wireless communication
Author :
Zhang, Botao ; Liu, Hengzhu ; Zhao, Heng ; Mo, Fangzheng ; Chen, Ting
Author_Institution :
Inst. of Microelectrics & Microprocessor, Nat. Univ. of Defense Technol., Changsha, China
Abstract :
In order to solve the challenges in processor design for the next generation wireless communication systems, this paper first proposes a system level design flow for communication domain specific processor, and then proposes a novel processor architecture for the next generation wireless communication named GAEA using this design flow. GAEA is a shared memory multi-core SoC based on Software Controlled Time Division Multiplexing Bus, with which programmers can easily explore memory-level parallelism of applications by proper instructions and scheduling algorithms. MPE, which is the kernel component of GAEA, adopts hybrid parallel processing scheme to explore instruction-level and data-level parallelism. The pipeline and instruction set of GAEA are also optimized for the next generation wireless communication systems. The evaluation and implementation results show that GAEA architecture is suitable for the next generation wireless communication systems.
Keywords :
integrated circuit design; scheduling; shared memory systems; software radio; system-on-chip; time division multiplexing; GAEA; communication domain specific processor; data-level parallelism; domain specific architecture; hybrid parallel processing scheme; instruction-level parallelism; memory-level parallelism; next generation wireless communication systems; processor design; scheduling algorithms; shared memory multicore SoC; software controlled time division multiplexing bus; software defined radio; system level design flow; Application software; Communication system control; Computer architecture; Kernel; Process design; Programming profession; Scheduling algorithm; System-level design; Time division multiplexing; Wireless communication;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
Print_ISBN :
978-1-4244-7054-9
DOI :
10.1109/DATE.2010.5457034