• DocumentCode
    2256199
  • Title

    Scoped identifiers for efficient bit aligned logging

  • Author

    Shea, Roy ; Srivastava, Mani ; Cho, Young

  • Author_Institution
    Comput. Sci. Dept., Univ. of California Los Angeles, Los Angeles, CA, USA
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    1450
  • Lastpage
    1455
  • Abstract
    Detailed diagnostic data is a prerequisite for debugging problems and understanding runtime performance in distributed wireless embedded systems. Severe bandwidth limitations, tight timing constraints, and limited program text space hinder the application of standard diagnostic tools within this domain. This work introduces the Log Instrumentation Specification (LIS), which provides a high level logging interface to developers and is able to create extremely compact diagnostic logs. LIS uses a token scoping technique to aggressively compact identifiers that are packed into bit aligned log buffers. LIS is evaluated in the context of recording call traces within a network of wireless sensor nodes. Our evaluation shows that logs generated using LIS require less than 50% of the bandwidth utilized by alternate logging mechanisms. Through microbench-marking of a complete LIS implementation for the TinyOS operating system, we demonstrate that LIS can comfortably fit onto low-end embedded systems. By significantly reducing log bandwidth, LIS enables extraction of a more complete picture of runtime behavior from distributed wireless embedded systems.
  • Keywords
    embedded systems; operating systems (computers); program debugging; program diagnostics; wireless sensor networks; LIS; TinyOS operating system; bandwidth limitations; debugging problems; detailed diagnostic data; distributed wireless embedded systems; efficient bit aligned logging; logging interface; scoped identifiers; wireless sensor nodes; Bandwidth; Computer science; Debugging; Distributed computing; Embedded computing; Embedded system; Encoding; Instruments; Runtime; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5457040
  • Filename
    5457040