Title :
Soft error-aware design optimization of low power and time-constrained embedded systems
Author :
Shafik, Rishad A. ; Al-Hashimi, Bashir M. ; Chakrabarty, Krishnendu
Author_Institution :
Sch. of ECS, Univ. of Southampton, Southampton, UK
Abstract :
In this paper, we examine the impact of application task mapping on the reliability of MPSoC in the presence of single-event upsets (SEUs). We propose a novel soft error-aware design optimization using joint power minimization with voltage scaling and reliability improvement through application task mapping. The aim is to minimize the number of SEUs experienced by the MPSoC for a suitably identified voltage scaling of the system processing cores such that the power is reduced and the specified real-time constraint is met.We evaluate the effectiveness of the proposed optimization technique using an MPEG-2 decoder and random task graphs. We show that for an MPEG-2 decoder with four processing cores, our optimization technique produces a design that experiences 38% less SEUs than soft error-unaware design optimization for a soft error rate of 10-9, while consuMPEG-2 decoderming 9% less power and meeting a given real-time constraint. Furthermore, we investigate the impact of architecture allocation (varying the number of MPSoC cores) on the power consumption and SEUs experienced. We show that for an MPSoC with six processing cores and a given real-time constraint, the proposed technique experiences upto 7% less SEUs compared to soft error-unaware optimization, while consuming only 3% more power.
Keywords :
embedded systems; low-power electronics; multiprocessing systems; optimisation; power aware computing; system-on-chip; MPEG-2 decoder; MPSoC reliability; application task mapping; joint power minimization; low power embedded systems; reliability improvement; single-event upsets; soft error-aware design optimization; system processing cores; task graphs; time-constrained embedded systems; voltage scaling; Constraint optimization; Decoding; Design optimization; Embedded system; Energy consumption; Error analysis; Power system reliability; Real time systems; Single event transient; Voltage;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
Print_ISBN :
978-1-4244-7054-9
DOI :
10.1109/DATE.2010.5457042